Thin Film Analysis (TFA)

The Luzchem Thin Film Analyzer (TFA) is a dissolution rate monitor with an optical measurement system designed for precise characterization of thin films used in materials research, coatings, photoresists, and polymer systems. The instrument measures thin film thickness and monitors dynamic film behavior using reflectance spectroscopy, providing researchers with real-time insight into film processes and material properties.

The TFA system measures films with thicknesses ranging from approximately 100 nm to 5 µm, with a reproducibility of about 1 nm or 0.2%, allowing accurate measurement of extremely thin coatings. The system uses a high-resolution spectrometer with 3648 detector array elements and a wavelength range of approximately 380 nm to 850 nm, providing detailed spectral information for precise thickness calculations.

The instrument uses a halogen light source and fiber-optic probe to illuminate the sample and collect reflected light for spectral analysis. The system is supplied with dedicated data acquisition and processing software, allowing researchers to analyze measurements in real time and store experimental data for further analysis. The instrument communicates with the computer via USB interface, and a laptop with pre-installed software is included with the system.

Two models are available: the TFA-11, which includes temperature monitoring, and the TFA-11CT, which adds temperature control for experiments where precise thermal conditions are required. Both systems support a wide range of sample sizes from approximately 0.5 cm to 25 cm, allowing analysis of both small laboratory samples and larger substrates.

With its combination of high-precision thickness measurement, real-time monitoring of film processes, and flexible experimental configuration, the Luzchem Thin Film Analyzer provides an effective solution for researchers studying thin film materials and surface processes.